Background Statement for SEMI Draft Document 5340 REVISION TO ...
6.1.8.5 SDT Production Test ? The time (production test downtime) SDT ....
wafers, warped lead frames); Test data (e.g., metrology equipment out of
calibration, ...... L1 and L2 are load lock equipment modules that are used to load
units into ...... or that require significant manual intervention should be tracked as
conversions ...